TY - JOUR
T1 - Solvent-Free Synthesis of Quaternary Metal Sulfide Nanoparticles Derived from Thiourea
AU - Bhunia, Manas Kumar
AU - Abou-Hamad, Edy
AU - Anjum, Dalaver H.
AU - Gurinov, Andrei
AU - Takanabe, Kazuhiro
N1 - KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: The research reported in this publication was supported by King Abdullah University of Science and Technology (KAUST). The authors are grateful to Dr. Ahmed Ziani at KAUST for assistance with the SEM observations.
PY - 2017/8/9
Y1 - 2017/8/9
N2 - The synthesis of metal sulfide (MS) materials with sizes in the sub-10 nm regime often requires capping agents with long hydrocarbon chains that affect their structures and properties. Herein, this study presents a molten-state synthesis method for a series of transition-MS nanoparticles using thiourea as a reactive precursor without capping agents. This study also reports the synthesis of MS with single metals (Fe, Co, Ni, Cu, and Zn) and quaternary CuGa2In3S8 using the same synthesis protocol. Thiourea first melts to form a molten-state condition to serve as the reaction medium at a relatively low temperature (
AB - The synthesis of metal sulfide (MS) materials with sizes in the sub-10 nm regime often requires capping agents with long hydrocarbon chains that affect their structures and properties. Herein, this study presents a molten-state synthesis method for a series of transition-MS nanoparticles using thiourea as a reactive precursor without capping agents. This study also reports the synthesis of MS with single metals (Fe, Co, Ni, Cu, and Zn) and quaternary CuGa2In3S8 using the same synthesis protocol. Thiourea first melts to form a molten-state condition to serve as the reaction medium at a relatively low temperature (
UR - http://hdl.handle.net/10754/625730
UR - http://onlinelibrary.wiley.com/doi/10.1002/ppsc.201700183/full
UR - http://www.scopus.com/inward/record.url?scp=85040811088&partnerID=8YFLogxK
U2 - 10.1002/ppsc.201700183
DO - 10.1002/ppsc.201700183
M3 - Article
SN - 0934-0866
VL - 35
SP - 1700183
JO - Particle & Particle Systems Characterization
JF - Particle & Particle Systems Characterization
IS - 1
ER -