Spatially resolved electric fields in polymer light-emitting diodes using fluorescence lifetime imaging

M. Koeberg; D. S. Elson; P. M.W. French; D. D.C. Bradley

doi:10.1016/S0379-6779(03)00312-6

Spatially resolved electric fields in polymer light-emitting diodes using fluorescence lifetime imaging

M. Koeberg, D. S. Elson, P. M.W. French, D. D.C. Bradley

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

Polymer light-emitting diode (LED) structures have been studied using fluorescence lifetime imaging (FLIM). FLIM allows one to image perturbations in the excited state of the luminescent polymer that lead to changes in its fluorescence lifetime. Observation of strong electric field induced luminescence lifetime quenching of a blue emitting polyfluorene type co-polymer enabled the spatial resolution of field strengths. For example, black spots (degradation induced defects in the LED) did not show any lifetime quenching upon applying an electric field in contrast to the surrounding polymer layer. Future applications of this technique in the field of thin film LEDs are suggested. © 2003 Elsevier Science B.V. All rights reserved.

Original language	English (US)
Title of host publication	Synthetic Metals
DOIs	https://doi.org/10.1016/S0379-6779(03)00312-6
State	Published - Oct 9 2003
Externally published	Yes

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title = "Spatially resolved electric fields in polymer light-emitting diodes using fluorescence lifetime imaging",

abstract = "Polymer light-emitting diode (LED) structures have been studied using fluorescence lifetime imaging (FLIM). FLIM allows one to image perturbations in the excited state of the luminescent polymer that lead to changes in its fluorescence lifetime. Observation of strong electric field induced luminescence lifetime quenching of a blue emitting polyfluorene type co-polymer enabled the spatial resolution of field strengths. For example, black spots (degradation induced defects in the LED) did not show any lifetime quenching upon applying an electric field in contrast to the surrounding polymer layer. Future applications of this technique in the field of thin film LEDs are suggested. {\textcopyright} 2003 Elsevier Science B.V. All rights reserved.",

author = "M. Koeberg and Elson, {D. S.} and French, {P. M.W.} and Bradley, {D. D.C.}",

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AU - Koeberg, M.

AU - Elson, D. S.

AU - French, P. M.W.

AU - Bradley, D. D.C.

N1 - Generated from Scopus record by KAUST IRTS on 2019-11-27

PY - 2003/10/9

Y1 - 2003/10/9

N2 - Polymer light-emitting diode (LED) structures have been studied using fluorescence lifetime imaging (FLIM). FLIM allows one to image perturbations in the excited state of the luminescent polymer that lead to changes in its fluorescence lifetime. Observation of strong electric field induced luminescence lifetime quenching of a blue emitting polyfluorene type co-polymer enabled the spatial resolution of field strengths. For example, black spots (degradation induced defects in the LED) did not show any lifetime quenching upon applying an electric field in contrast to the surrounding polymer layer. Future applications of this technique in the field of thin film LEDs are suggested. © 2003 Elsevier Science B.V. All rights reserved.

AB - Polymer light-emitting diode (LED) structures have been studied using fluorescence lifetime imaging (FLIM). FLIM allows one to image perturbations in the excited state of the luminescent polymer that lead to changes in its fluorescence lifetime. Observation of strong electric field induced luminescence lifetime quenching of a blue emitting polyfluorene type co-polymer enabled the spatial resolution of field strengths. For example, black spots (degradation induced defects in the LED) did not show any lifetime quenching upon applying an electric field in contrast to the surrounding polymer layer. Future applications of this technique in the field of thin film LEDs are suggested. © 2003 Elsevier Science B.V. All rights reserved.

UR - https://linkinghub.elsevier.com/retrieve/pii/S0379677903003126

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U2 - 10.1016/S0379-6779(03)00312-6

DO - 10.1016/S0379-6779(03)00312-6

M3 - Conference contribution

BT - Synthetic Metals

ER -

Spatially resolved electric fields in polymer light-emitting diodes using fluorescence lifetime imaging

Abstract

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