Structural and magnetic properties of FeN gradient thin films

E. Y. Jiang; D. C. Sun; H. Liu; H. L. Bai; X. X. Zhang

doi:10.1016/0304-8853(94)01568-6

Structural and magnetic properties of FeN gradient thin films

E. Y. Jiang^*, D. C. Sun, H. Liu, H. L. Bai, X. X. Zhang

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

FeN gradient thin films are fabricated by a facing targets sputtering (FTS) system. Rutherford backscattering spectrometry shows that the concentration of Fe atoms or N atoms varies gradually from the substrate to the surface of the film. The FeN gradient films contain crystal phases of δ-Fe₂N, ε{lunate}-Fe_xN (2 < x <-3), γ′-Fe₄N and α″-Fe₁₆N₂ and amorphous FeN as well, according to different sputtering conditions.

Original language	English (US)
Pages (from-to)	719-720
Number of pages	2
Journal	Journal of Magnetism and Magnetic Materials
Volume	140-144
Issue number	PART 1
DOIs	https://doi.org/10.1016/0304-8853(94)01568-6
State	Published - Feb 1995
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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title = "Structural and magnetic properties of FeN gradient thin films",

abstract = "FeN gradient thin films are fabricated by a facing targets sputtering (FTS) system. Rutherford backscattering spectrometry shows that the concentration of Fe atoms or N atoms varies gradually from the substrate to the surface of the film. The FeN gradient films contain crystal phases of δ-Fe2N, ε{lunate}-FexN (2 < x <-3), γ′-Fe4N and α″-Fe16N2 and amorphous FeN as well, according to different sputtering conditions.",

author = "Jiang, {E. Y.} and Sun, {D. C.} and H. Liu and Bai, {H. L.} and Zhang, {X. X.}",

year = "1995",

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doi = "10.1016/0304-8853(94)01568-6",

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journal = "Journal of Magnetism and Magnetic Materials",

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TY - JOUR

T1 - Structural and magnetic properties of FeN gradient thin films

AU - Jiang, E. Y.

AU - Sun, D. C.

AU - Liu, H.

AU - Bai, H. L.

AU - Zhang, X. X.

PY - 1995/2

Y1 - 1995/2

N2 - FeN gradient thin films are fabricated by a facing targets sputtering (FTS) system. Rutherford backscattering spectrometry shows that the concentration of Fe atoms or N atoms varies gradually from the substrate to the surface of the film. The FeN gradient films contain crystal phases of δ-Fe2N, ε{lunate}-FexN (2 < x <-3), γ′-Fe4N and α″-Fe16N2 and amorphous FeN as well, according to different sputtering conditions.

AB - FeN gradient thin films are fabricated by a facing targets sputtering (FTS) system. Rutherford backscattering spectrometry shows that the concentration of Fe atoms or N atoms varies gradually from the substrate to the surface of the film. The FeN gradient films contain crystal phases of δ-Fe2N, ε{lunate}-FexN (2 < x <-3), γ′-Fe4N and α″-Fe16N2 and amorphous FeN as well, according to different sputtering conditions.

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U2 - 10.1016/0304-8853(94)01568-6

DO - 10.1016/0304-8853(94)01568-6

M3 - Article

AN - SCOPUS:17044455953

SN - 0304-8853

VL - 140-144

SP - 719

EP - 720

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - PART 1

ER -

Structural and magnetic properties of FeN gradient thin films

Abstract

ASJC Scopus subject areas

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