Structural and magnetic properties of TM-SiO2 (TM = Fe, Co, Ni) films

L. M. Socolovsky; J. C. Denardin; A. L. Brandl; M. Knobel; X. X. Zhang

doi:10.1016/S0304-8853(03)00028-3

Structural and magnetic properties of TM-SiO₂ (TM = Fe, Co, Ni) films

L. M. Socolovsky^*, J. C. Denardin, A. L. Brandl, M. Knobel, X. X. Zhang

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

9 Scopus citations

Abstract

TM_x-(SiO₂)_1-x (TM = Fe, Co, Ni) thin films were prepared in a wide concentration range (0.35 ≤x≤1). Structure was studied with transmission electron microscopy (TEM), X-ray diffraction (XRD) and small angle X-ray scattering (SAXS). Magnetic and magnetotransport properties were investigated by means of magnetization and Hall effect measurements. TEM images display nanometric spherical structures embedded in a SiO₂ amorphous matrix, with typical sizes increasing from 3 to 5nm when TM volume concentration x is increased. SAXS measurements indicate a complex structure formed by nanosized objects. XRD measurements show that the structure is composed by amorphous SiO₂ and TM crystallites. Slightly above the percolation threshold all samples display giant Hall effect. The observed magnetic properties are dependent on x, and display an evolution resulting from the progressive increase of the mean particle size.

Original language	English (US)
Pages (from-to)	102-106
Number of pages	5
Journal	Journal of Magnetism and Magnetic Materials
Volume	262
Issue number	1
DOIs	https://doi.org/10.1016/S0304-8853(03)00028-3
State	Published - May 2003
Externally published	Yes
Event	Vision Geometry VII - San Diego, CA, United States Duration: Jul 20 1998 → Jul 22 1998

Keywords

Magnetic nanoparticles
Magnetic thin films
SAXS

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1016/S0304-8853(03)00028-3

Cite this

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title = "Structural and magnetic properties of TM-SiO2 (TM = Fe, Co, Ni) films",

abstract = "TMx-(SiO2)1-x (TM = Fe, Co, Ni) thin films were prepared in a wide concentration range (0.35 ≤x≤1). Structure was studied with transmission electron microscopy (TEM), X-ray diffraction (XRD) and small angle X-ray scattering (SAXS). Magnetic and magnetotransport properties were investigated by means of magnetization and Hall effect measurements. TEM images display nanometric spherical structures embedded in a SiO2 amorphous matrix, with typical sizes increasing from 3 to 5nm when TM volume concentration x is increased. SAXS measurements indicate a complex structure formed by nanosized objects. XRD measurements show that the structure is composed by amorphous SiO2 and TM crystallites. Slightly above the percolation threshold all samples display giant Hall effect. The observed magnetic properties are dependent on x, and display an evolution resulting from the progressive increase of the mean particle size.",

keywords = "Magnetic nanoparticles, Magnetic thin films, SAXS",

author = "Socolovsky, {L. M.} and Denardin, {J. C.} and Brandl, {A. L.} and M. Knobel and Zhang, {X. X.}",

year = "2003",

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note = "Vision Geometry VII ; Conference date: 20-07-1998 Through 22-07-1998",

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TY - JOUR

T1 - Structural and magnetic properties of TM-SiO2 (TM = Fe, Co, Ni) films

AU - Socolovsky, L. M.

AU - Denardin, J. C.

AU - Brandl, A. L.

AU - Knobel, M.

AU - Zhang, X. X.

PY - 2003/5

Y1 - 2003/5

N2 - TMx-(SiO2)1-x (TM = Fe, Co, Ni) thin films were prepared in a wide concentration range (0.35 ≤x≤1). Structure was studied with transmission electron microscopy (TEM), X-ray diffraction (XRD) and small angle X-ray scattering (SAXS). Magnetic and magnetotransport properties were investigated by means of magnetization and Hall effect measurements. TEM images display nanometric spherical structures embedded in a SiO2 amorphous matrix, with typical sizes increasing from 3 to 5nm when TM volume concentration x is increased. SAXS measurements indicate a complex structure formed by nanosized objects. XRD measurements show that the structure is composed by amorphous SiO2 and TM crystallites. Slightly above the percolation threshold all samples display giant Hall effect. The observed magnetic properties are dependent on x, and display an evolution resulting from the progressive increase of the mean particle size.

AB - TMx-(SiO2)1-x (TM = Fe, Co, Ni) thin films were prepared in a wide concentration range (0.35 ≤x≤1). Structure was studied with transmission electron microscopy (TEM), X-ray diffraction (XRD) and small angle X-ray scattering (SAXS). Magnetic and magnetotransport properties were investigated by means of magnetization and Hall effect measurements. TEM images display nanometric spherical structures embedded in a SiO2 amorphous matrix, with typical sizes increasing from 3 to 5nm when TM volume concentration x is increased. SAXS measurements indicate a complex structure formed by nanosized objects. XRD measurements show that the structure is composed by amorphous SiO2 and TM crystallites. Slightly above the percolation threshold all samples display giant Hall effect. The observed magnetic properties are dependent on x, and display an evolution resulting from the progressive increase of the mean particle size.

KW - Magnetic nanoparticles

KW - Magnetic thin films

KW - SAXS

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