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Structural and magnetoresistive properties of half metallic Co2Mn1-xSi thin films
K. B. Li*, J. J. Qiu, P. Luo, L. H. An, Z. B. Guo, Y. K. Zheng, G. C. Han, Y. H. Wu, S. J. Wang
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
2
Scopus
citations