Study of optical properties of metallic Aux(SiO2)1-x and Nix(SiO2)1-x films

Y. Wang*, X. X. Zhang, X. Yan, R. J. Zhang, L. Y. Chen, Y. X. Zheng, S. Y. Wang, S. M. Zhou, Y. M. Yang, N. Dai

*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

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