Study on SRAM soft failure using planar-view transmission electron microscopy techniques

P. Liu*, K. Li, Y. Li, C. Q. Chen, E. Er, J. Teong

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Study on SRAM soft failure using planar-view transmission electron microscopy techniques'. Together they form a unique fingerprint.

Physics

Engineering

INIS

Computer Science

Material Science