TY - GEN
T1 - Sum of ratios of products forα-μ random variables in wireless multihop relaying and multiple scattering
AU - Wang, Kezhi
AU - Wang, Tian
AU - Chen, Yunfei
AU - Alouini, Mohamed-Slim
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2014/9
Y1 - 2014/9
N2 - The sum of ratios of products of independent 2642 2642α-μ random variables (RVs) is approximated by using the Generalized Gamma ratio approximation (GGRA) with Gamma ratio approximation (GRA) as a special case. The proposed approximation is used to calculate the outage probability of the equal gain combining (EGC) or maximum ratio combining (MRC) receivers for wireless multihop relaying or multiple scattering systems considering interferences. Numerical results show that the newly derived approximation works very well verified by the simulation, while GRA has a slightly worse performance than GGRA when outage probability is below 0.1 but with a more simplified form.
AB - The sum of ratios of products of independent 2642 2642α-μ random variables (RVs) is approximated by using the Generalized Gamma ratio approximation (GGRA) with Gamma ratio approximation (GRA) as a special case. The proposed approximation is used to calculate the outage probability of the equal gain combining (EGC) or maximum ratio combining (MRC) receivers for wireless multihop relaying or multiple scattering systems considering interferences. Numerical results show that the newly derived approximation works very well verified by the simulation, while GRA has a slightly worse performance than GGRA when outage probability is below 0.1 but with a more simplified form.
UR - http://hdl.handle.net/10754/564983
UR - http://ieeexplore.ieee.org/document/6966193/
UR - http://www.scopus.com/inward/record.url?scp=84919458495&partnerID=8YFLogxK
U2 - 10.1109/VTCFall.2014.6966193
DO - 10.1109/VTCFall.2014.6966193
M3 - Conference contribution
SN - 9781479944491; 9781479944491
BT - 2014 IEEE 80th Vehicular Technology Conference (VTC2014-Fall)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -