Surface roughness parameters measurements by Digital Holographic Mcroscopy (DHM)

Frédéric Montfort*, Yves Emery, Eduardo Solanas, Etienne Cuche, Nicolas Aspert, Pierre Marquet, Claude Joris, Jonas Kühn, Christian Depeursing

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

16 Scopus citations

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