Temperature imaging of mobile BaMgAl10O17:Eu phosphor aggregates under high radiation flux

Wanxia Zhao, Kimberley C.Y. Kueh, Graham J. Nathan, Zeyad T. Alwahabi*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Planar laser-induced phosphorescence (PLIP) has been used for the temperature measurement of suspended phosphor aggregates. Two-dimensional surface temperature of fluidized phosphor aggregates was measured through a pair of spatial and wavelength resolved images in an environment where phosphors are heated by high-flux radiation. The heating was supplied by a multi-diode laser system which provides a well-characterized high-flux radiation up to 28.87 MW/m2. Phosphors made of BaMgAl10O17:Eu (BAM) were selected as the material and suspended in a fluidized bed. Single-shot temperature imaging of BAM aggregates were inferred and compared at several heat fluxes. With the increasing heat flux up to 28.87 MW/m2, the BAM aggregates were found to exhibit a wider range of temperature distribution, and the maximum average aggregate temperature achieved 723 K, while the maximum temperature of a single aggregate could reach up to 1063 K. The wider temperature distributions that observed under higher radiation fluxes were caused by the elevated temperature of cooling air and the non-uniform aggregate surfaces. This non-intrusive method of measuring temperature offers advantages over other available methods in the study of heat transfer processes involving high-temperature reactions.

Original languageEnglish (US)
Article number106398
JournalOptics and Lasers in Engineering
Volume137
DOIs
StatePublished - Feb 2021

Keywords

  • Homogeneous radiation heating
  • Laser-induced phosphorescence (LIP)
  • Planar temperature imaging of suspended aggregates
  • Thermographic phosphors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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