TY - GEN
T1 - The effect of Cytochalasin D on F-Actin behavior of single-cell electroendocytosis using multi-chamber micro cell chip
AU - Lin, Ran
AU - Chang, Donald C.
AU - Lee, Yi-Kuen
N1 - KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): SA-C0040, UK-COOI6
Acknowledgements: The research was sponsored by a grant from Hong Kong Research Grants Council (Grant Ref. No. 615907) and by an award from the King Abdullah University of Science and Technology (KAUST Award No. SA-C0040/UK-COOI6).
This publication acknowledges KAUST support, but has no KAUST affiliated authors.
PY - 2012/3
Y1 - 2012/3
N2 - Electroendocytosis (EED) is a pulsed-electric-field (PEF) induced endocytosis, facilitating cells uptake molecules through nanometer-sized EED vesicles. We herein investigate the effect of a chemical inhibitor, Cytochalasin D (CD) on the actin-filaments (F-Actin) behavior of single-cell EED. The CD concentration (C CD) can control the depolymerization of F-actin. A multi-chamber micro cell chip was fabricated to study the EED under different conditions. Large-scale single-cell data demonstrated EED highly depends on both electric field and C CD. © 2012 IEEE.
AB - Electroendocytosis (EED) is a pulsed-electric-field (PEF) induced endocytosis, facilitating cells uptake molecules through nanometer-sized EED vesicles. We herein investigate the effect of a chemical inhibitor, Cytochalasin D (CD) on the actin-filaments (F-Actin) behavior of single-cell EED. The CD concentration (C CD) can control the depolymerization of F-actin. A multi-chamber micro cell chip was fabricated to study the EED under different conditions. Large-scale single-cell data demonstrated EED highly depends on both electric field and C CD. © 2012 IEEE.
UR - http://hdl.handle.net/10754/600264
UR - http://ieeexplore.ieee.org/document/6196744/
UR - http://www.scopus.com/inward/record.url?scp=84861542073&partnerID=8YFLogxK
U2 - 10.1109/nems.2012.6196744
DO - 10.1109/nems.2012.6196744
M3 - Conference contribution
SN - 9781467311243
SP - 150
EP - 153
BT - 2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -