The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors

Youngsuk Jung, R. Joseph Kline, Eric K. Lin, Daniel A. Fischer, Michael F. Toney, Martin Heeney, Iain McCulloch, Dean M. DeLongchamp

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The performance of organic field-effect transistors (OFETs) significantly depends on the properties of the interface between the semiconductor and gate dielectric. Here, we study the impact of chemically modified and morphologically controlled dielectrics on the performance of poly(2,5-bis(3-alkylthiophen-2-yl) thieno[3,2-bjthiophene) (pBTTT) semiconductors. We find that the molecular packing, domain size, and carrier mobility of pBTTT are highly sensitive to dielectric chemistry and dielectric roughness. The large and well-oriented terraced domains that are the origin of pBTTTs high performance can develop well on certain dielectrics, but can be disrupted on others. © The Electrochemical Society.
Original languageEnglish (US)
Title of host publicationECS Transactions
Pages113-122
Number of pages10
DOIs
StatePublished - Nov 18 2008
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering

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