The progress and challenges of threshold voltage control of high-k/metal-gated devices for advanced technologies (Invited Paper)

Hsing Huang Tseng*, Paul Kirsch, C. S. Park, Gennadi Bersuker, Prashant Majhi, Muhammad Hussain, Raj Jammy

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Fingerprint

Dive into the research topics of 'The progress and challenges of threshold voltage control of high-k/metal-gated devices for advanced technologies (Invited Paper)'. Together they form a unique fingerprint.

Material Science

Keyphrases