Thermally stable N-metal gate MOSFETs using La-incorporated HfSiO dielectric

H. N. Alshareef, H. R. Harris, H. C. Wen, C. S. Park, C. Huffman, K. Choi, H. F. Luan, P. Majhi, B. H. Lee, R. Jammy, D. J. Lichtenwalner, J. S. Jur, A. I. Kingon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

59 Scopus citations

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Material Science