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Dive into the research topics of 'Thermally stable N-metal gate MOSFETs using La-incorporated HfSiO dielectric'. Together they form a unique fingerprint.- Sort by
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H. N. Alshareef, H. R. Harris, H. C. Wen, C. S. Park, C. Huffman, K. Choi, H. F. Luan, P. Majhi, B. H. Lee, R. Jammy, D. J. Lichtenwalner, J. S. Jur, A. I. Kingon
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review