Abstract
We present a complete description of "topological darkness" in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films. © 2015 OSA.
Original language | English (US) |
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Title of host publication | CLEO: Applications and Technology, CLEO-AT 2015 |
Publisher | Optical Society of America |
ISBN (Print) | 9781557529688 |
DOIs | |
State | Published - May 4 2015 |
Externally published | Yes |