Topological darkness revisited: A four-dimensional picture

Haomin Song; Xie Zeng; Dengxin Ji; Nan Zhang; Kai Liu; Qiaoqiang Gan

Topological darkness revisited: A four-dimensional picture

Haomin Song, Xie Zeng, Dengxin Ji, Nan Zhang, Kai Liu, Qiaoqiang Gan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a complete description of 'topological darkness' in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.

Original language	English (US)
Title of host publication	Conference on Lasers and Electro-Optics Europe - Technical Digest
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781557529688
State	Published - Aug 10 2015
Externally published	Yes

Cite this

@inproceedings{a4c09535dfde4d64b6bbe658c57d579f,

title = "Topological darkness revisited: A four-dimensional picture",

abstract = "We present a complete description of 'topological darkness' in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.",

author = "Haomin Song and Xie Zeng and Dengxin Ji and Nan Zhang and Kai Liu and Qiaoqiang Gan",

note = "Generated from Scopus record by KAUST IRTS on 2022-09-13",

year = "2015",

month = aug,

day = "10",

language = "English (US)",

isbn = "9781557529688",

booktitle = "Conference on Lasers and Electro-Optics Europe - Technical Digest",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

}

TY - GEN

T1 - Topological darkness revisited: A four-dimensional picture

AU - Song, Haomin

AU - Zeng, Xie

AU - Ji, Dengxin

AU - Zhang, Nan

AU - Liu, Kai

AU - Gan, Qiaoqiang

N1 - Generated from Scopus record by KAUST IRTS on 2022-09-13

PY - 2015/8/10

Y1 - 2015/8/10

N2 - We present a complete description of 'topological darkness' in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.

AB - We present a complete description of 'topological darkness' in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.

UR - http://www.scopus.com/inward/record.url?scp=84954052845&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557529688

BT - Conference on Lasers and Electro-Optics Europe - Technical Digest

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Topological darkness revisited: A four-dimensional picture

Abstract

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