Two-probe electrical measurements in transmission electron microscopes-behavioral control of tungsten microwires

Pedro M.F.J. Costa; Xiaosheng Fang; Shiliang Wang; Yuehui He; Yoshio Bando; Masanori Mitome; Jin Zou; Han Huang; Dmitri Golberg

doi:10.1002/jemt.20648

Two-probe electrical measurements in transmission electron microscopes-behavioral control of tungsten microwires

Pedro M.F.J. Costa, Xiaosheng Fang, Shiliang Wang, Yuehui He, Yoshio Bando, Masanori Mitome, Jin Zou, Han Huang, Dmitri Golberg

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using Au electrodes, the current-voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au-W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses.

Original language	English (US)
Pages (from-to)	93-100
Number of pages	8
Journal	Microscopy Research and Technique
Volume	72
Issue number	2
DOIs	https://doi.org/10.1002/jemt.20648
State	Published - Feb 2009
Externally published	Yes

Keywords

Electrical contacts
I-V
TEM
Tungsten

ASJC Scopus subject areas

Anatomy
Histology
Instrumentation
Medical Laboratory Technology

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10.1002/jemt.20648

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abstract = "Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using Au electrodes, the current-voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au-W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses.",

keywords = "Electrical contacts, I-V, TEM, Tungsten",

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AU - Costa, Pedro M.F.J.

AU - Fang, Xiaosheng

AU - Wang, Shiliang

AU - He, Yuehui

AU - Bando, Yoshio

AU - Mitome, Masanori

AU - Zou, Jin

AU - Huang, Han

AU - Golberg, Dmitri

PY - 2009/2

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AB - Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using Au electrodes, the current-voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au-W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses.

KW - Electrical contacts

KW - I-V

KW - TEM

KW - Tungsten

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Two-probe electrical measurements in transmission electron microscopes-behavioral control of tungsten microwires

Abstract

Keywords

ASJC Scopus subject areas

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