Ultrasensitive broadband infrared 4 × 4 Mueller-matrix ellipsometry for studies of depolarizing and anisotropic thin films

Andreas Furchner, Christoph Kratz, Wojciech Ogieglo, Ingo Pinnau, Jörg Rappich, Karsten Hinrichs

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'Ultrasensitive broadband infrared 4 × 4 Mueller-matrix ellipsometry for studies of depolarizing and anisotropic thin films'. Together they form a unique fingerprint.

Keyphrases

Physics

Material Science