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Dive into the research topics of 'Ultrasensitive broadband infrared 4 × 4 Mueller-matrix ellipsometry for studies of depolarizing and anisotropic thin films'. Together they form a unique fingerprint.- Sort by
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Andreas Furchner, Christoph Kratz, Wojciech Ogieglo, Ingo Pinnau, Jörg Rappich, Karsten Hinrichs
Research output: Contribution to journal › Article › peer-review