Wavefront sensor and method of reconstructing distorted wavefronts

Congli Wang; Xiong Dun; Qiang Fu; Wolfgang Heidrich

Wavefront sensor and method of reconstructing distorted wavefronts

Congli Wang (Inventor), Xiong Dun (Inventor), Qiang Fu (Inventor), Wolfgang Heidrich (Inventor)

Research output: Patent

Abstract

A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.

Original language	English (US)
Patent number	WO2018083573A1
State	Published - May 11 2018

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https://repository.kaust.edu.sa/bitstream/10754/629647/1/WO2018083573A1.pdf

Cite this

@misc{9315169f055e43a981b08cd34c7e2a6b,

title = "Wavefront sensor and method of reconstructing distorted wavefronts",

abstract = "A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.",

author = "Congli Wang and Xiong Dun and Qiang Fu and Wolfgang Heidrich",

note = "KAUST Repository Item: Exported on 2019-02-13; WO2018083573A1",

year = "2018",

month = may,

day = "11",

language = "English (US)",

type = "Patent",

}

TY - PAT

T1 - Wavefront sensor and method of reconstructing distorted wavefronts

AU - Wang, Congli

AU - Dun, Xiong

AU - Fu, Qiang

AU - Heidrich, Wolfgang

N1 - KAUST Repository Item: Exported on 2019-02-13

PY - 2018/5/11

Y1 - 2018/5/11

N2 - A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.

AB - A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.

UR - http://hdl.handle.net/10754/629647

UR - https://patents.google.com/patent/WO2018083573A1/en

M3 - Patent

M1 - WO2018083573A1

ER -

Wavefront sensor and method of reconstructing distorted wavefronts

Abstract

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