TY - JOUR
T1 - Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
AU - Lanza, Mario
AU - Smets, Quentin
AU - Huyghebaert, Cedric
AU - Li, Lain-Jong
N1 - KAUST Repository Item: Exported on 2020-11-16
PY - 2020/11/10
Y1 - 2020/11/10
N2 - The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
AB - The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
UR - http://hdl.handle.net/10754/665950
UR - http://www.nature.com/articles/s41467-020-19053-9
UR - http://www.scopus.com/inward/record.url?scp=85095785783&partnerID=8YFLogxK
U2 - 10.1038/s41467-020-19053-9
DO - 10.1038/s41467-020-19053-9
M3 - Article
C2 - 33173041
SN - 2041-1723
VL - 11
JO - Nature Communications
JF - Nature Communications
IS - 1
ER -