For years, electron beam induced deposition has been used to fabricate electrical contacts for micro and nanostructures. The role of the contact resistance is key to achieve high performance and efficiency in electrical devices. The present thesis reports on the electrical, structural and chemical characterization of electron beam deposited platinum electrodes that are exposed to different steps of thermal annealing and how they are used in four-probe devices of ultrathin graphite (uG) flakes (
Date of Award | May 3 2016 |
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Original language | English (US) |
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Awarding Institution | - Physical Sciences and Engineering
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Supervisor | Pedro M.F.J. Costa (Supervisor) |
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- Contact
- Graphene
- Graphite
- Device
- Annealing